Measure and map sheet resistances

Measure and map sheet resistances

A layer’s sheet resistance and information derived from the same – such as the specific resistance, the charge carrier density or the layer thickness – are basic parameters that are needed in many fields of the semiconductor and photovoltaics industries. The four-point measurement technique is a proven method for determining these parameters.

4Dimensions’ more than 35 years of experience in this field is reflected in the sheer diversity and many sophisticated detailed solutions of the systems presented here.