Metro.Lab—the
compact white-light interferometer

Seize a large single field of view 37 × 28 mm (~1.24 Mpts) for mid- to large sized sampels in a single shot. With extended lateral coverage up to 87 × 78 mm it even allows for multi-sample measurements and quick pass/fail checks. In vertical (Z Axis), the specimen height can range from 0 to 70 mm. 

With the telecentric optics and a large z scan range, Metro.Lab reaches deep holes, bores or recessed areas while keeping a safe gap to the part and thus avoiding collision. 

This is particularly helpful on macroscopic components with bores or recesses where conventional optics face shadowing effects.

A 70 mm vertical measuring range handles large steps and form deviations, while nanometer-scale performance supports tight tolerances: <2.85 nm vertical resolution (phase evaluation). 

The rugged design without moving parts demonstrates a low measurement noise and high repeatability. In addition a vibration damping system is integrated to rougher environments.

TopMap profilers support recipe-based measurements for recurring inspections and testing routines. Barcode scanners load predefined settings and evluations. The software automatically recognizes lay and form of your sample type avoiding any need for mechanical fixture. Operators start ISO compliant and reproducible measurements with just one click without further training.

Evaluations follow DIN/ISO standards (e.g., ISO 25178, ISO 4287/4288). Results are visualized with clear pass/fail, and reports can be archived or exported to QS-STAT™ for SPC—supporting efficiency, repeatability, and traceability in lab or production.