台式光学表面轮廓仪

TopMap Micro.View是易于使用且紧凑的光学轮廓仪。 结合卓越的性能及实惠价格并具有强大的计量解决方案并。Micro.View的垂直测量范围可扩展到100 毫米和CST连续扫描技术，可在纳米分辨率下测量复杂的形貌。 这种便捷的桌面设置具有集成的电子设备，并带有智能聚焦查找器，可简化并加快测量过程。

亮点

  • 在紧凑的装置中测量表面光洁度
  • 非接触式3D地形，粗糙度和纹理的测量
  • 采用CST连续扫描技术可达到100毫米垂直测量范围
  • 高超的横向分辨率
  • 可从特定于应用程序中选择
TopMap Micro.View table-top optical 3D surface profiler
TopMap Micro.View table-top optical 3D surface profiler
TopMap Micro.View with innovative continuous scanning technology
CST Continuous Scanning Technology allows to use the entire 100 mm positioning range as measurement range
Non-contact surface roughness measurement in an areal 3D profile
Non-contact surface roughness measurement in an areal 3D profile
Analyze microstructure topography with nanometer resolution
Analyze microstructure topography with nanometer resolution
TopMap Micro.View table-top optical 3D surface profiler
TopMap Micro.View table-top optical 3D surface profiler
TopMap Micro.View with innovative continuous scanning technology
CST Continuous Scanning Technology allows to use the entire 100 mm positioning range as measurement range
Non-contact surface roughness measurement in an areal 3D profile
Non-contact surface roughness measurement in an areal 3D profile
Analyze microstructure topography with nanometer resolution
Analyze microstructure topography with nanometer resolution

面积小但具有功能扩展

受益于可选的ECT环境补偿技术，即使在嘈杂和充满挑战的生产环境中，也能确保可靠和准确的测量结果。 Micro.View是一种经济有效的质量控制仪器，用于在制造和研究中检查精密的工程表面。

 

 

Xperts inside! 新一代光学表面轮廓仪

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