TopMap QC Package
Accessories and upgrade options for surface quality inspections in production environments










For surface quality inspections in production
Industrial production benefits from tightly integrating surface metrology into the manufacturing process. With such tight integration, the inspection feedback allows immediate and cost-efficient control responses. Polytec’s TopMap surface metrology systems are designed to monitor manufacturing processes, assuring that production tolerances and process capabilities are met.
Reduce rejection rates – increase process capability
A whole new package of smart features for quality control tasks are now available for the TopMap 3D surface profiling systems - the TopMap QC Package supports surface inspections especially in challenging production environments.
- The QC Verifier avoids false rejects in challenging production environments by compensating for environmental disturbances that impact the precision measurement.
- The QC Software Customization provides for application-specific adaptations in software and easy integration of inline measurements.
- The QC Operator Interface offers simple one-click solutions at production level thanks to pre-defined measurement recipes.
- The QC Setting Comparator helps achieve global standardization with simplified monitoring of measurement settings and fast diagnostics.
- The QC Protection Housing provides significant resistance to rough production environments.
- The QC Barcode Scanner simplifies loading the right settings and avoids operator failures.
- Avoid false rejects in challenging production environments with the innovative ECT Environmental Compensation Technology
- Time-saving motorized tip-tilt unit for precise sample positioning
- Simple one-click solutions avoid operator failures and save time
- Achieve and monitor global quality standards
- Protect measurements in rough production environments
- Simplified loading of settings saves time
- Ask for customized software to meet your individual needs
TopMap optical surface metrology using ECT Environmental Compensation Technology
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