
|
 |
Applications |
Surface measurements are needed in many industries. Components and structures ranging from submillimeter to centimeter size can be found in the semiconductor and data storage industries, in microstructure and sensor markets, and in engineering and automotive applications. |
 |
|
|
Copyright 2007 Polytec GmbH Technical specifications are subject to change. |
|
Meeting Critical Flatness Specifications of Mirror Holders
Critically precise mirror holders are used in the Geometry Scan Unit of Polytec’s Scanning Vibrometer. These holders are manufactured in an automated machining center installed in Polytec’s production machine shop. Stresses induced in the part from the machining can impair the flatness of the mirror mounting surface. Deviations from acceptable flatness tolerances were identified using a TopMap Topography Measurement System and were corrected appropriately in the manufacturing process.
|
 |
 Flatness of a mirror holder |
|
3-D Measurements on Shock Absorber Pistons
When manufacturing working pistons for automobile shock absorbers, very tight tolerances must be adhered to regarding shape and surface parameters, and this despite high throughput. White-light interferometry as an optical measurement technology provides the topography of all the surfaces within seconds with a high level of repeatability.
|
 |
 Topography of shock absorber piston |
|
Measurement of Security Features on Banknotes
Various security features on banknotes are intended to protect against counterfeiting and to help in recognizing counterfeit notes. A common characteristic is raised print – the result of a special printing process. This is what typically gives banknotes their unique feel, whereas the printing height of counterfeit notes is often quite flat and difficult to sense. The inspection of print height can be done quickly and easily with White-Light Interferometry.
|
 |
 Measurement of bank notes |
|
Functional Surfaces
Structured functional surfaces with tight tolerances require high-precision measurement systems that can quickly record the surface topography of a work piece or object. White-light interferometry can make vertical measurements with an accuracy of a few nanometers and even subnanometers.
|
 |
 Atomizer membrane |
|
Bottom Flatness of Blind Holes
Inspecting blind hole bottoms for flatness and parallelism with respect to the top surface is difficult for high-aspect ratio holes (deep and narrow). The TopMap Pro.Lab can make these measurements for holes under 50 mm deep, and the TopMap Metro.Lab easily allows measurements in drill holes that are up to 70 mm deep.
|
 |
 Measurement in blind hole |
|
Surface Measurement in Production Environments
Surface properties, such as roughness, are important parameters for quality assurance. High throughput quality control is easily realized using TopMap white-light interferometers. The measurement itself is quick and fully automated, as are the analysis, savings and transfer of the results to the process control software.
|
 |
 Surface Measurement in Production |
|
Quality Control for Hard Disk Components
A manufacturer of various components for hard disk drives such as bearing sleeves, shafts and disk hubs, uses TopMap systems for quality control along with several other measurement techniques. The quality of fluid dynamic bearings (FDB) is of particular interest.
|
 |
 Topography of a counterplate |
|
Topography of Laser Chips
For reasons of quality control it is necessary to measure the complete topography of the laser chips. This can easily be done with the Polytec TopMap white light interferometer. Every data point has a x, y and z coordinate so very flexible data analysis can be done.
|
 |
 Laser chip measurement |
|
Flatness of Plastic Foils
The topography of transparent plastic foils is measured with the TMS-600 TopMap Pro.Lab system. The amplitude of the waves is of the order of some hundred nanometers. With this measurement it´s possible to control the production process of the plastic foils.
|
 |
 Plastic foil topography |
|
TopMap Application Notes
Polytec Application Notes describe how Polytec’s optical measurement systems are being used in various fields of application in semiconductor and data storage industries, in microstructure and sensor markets, and in engineering and automotive development. The download page lists Application Notes specific to TopMap applications.
|
 |
 Polytec Application Note |
|
|