On-line, 6/12/2008 - 6/12/2008Time: 11:00 PT
Conventional Disk Testers are used to scan the surface of the disk to locate defects.
Today’s disk drives require fast, accurate measurements not only of morphological features (e.g. µ-Waviness, Roughness) but also Nano-Defects (nano-pits as well as nano-asperities).
The THôT Nano-Scan system measures surface morphology and finds Nano-defects using the high resolution measurement capability of the Polytec Laser Doppler Vibrometers. The Polytec laser systems enable measurements of defects (both height and depth) to the sub-Angstrom level (»0.01Å) and maintains this measurement capability down to 0.1µm spatial resolution.
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