Form Parameters

Form Parameters

Polytec is a worldwide leader in optical topography measurement technology for large surface characterization with nanometer resolution. Determining parallelity, flatness, curvature, step height and other parameters are typical tasks for this technology. The surfaces to be examined are often situated in areas that are difficult to inspect using most methods – an easy task for Polytec's scanning white light systems in contrast to the difficulty associated with contact profilometry or optical coherent interferometry.

Acquiring the Topography

In many cases, the entire topography of a workpiece or object must be checked to verify specifications. Imprints, safety features and even forensic evidence can be analyzed with nanometer accuracy using white light interferometry. Also easily analyzed are the warping and deformation of structures, such as printed circuit boards. These require much tighter tolerances these days as the dimensions of mounted components continue to shrink.

Acquiring the Topography