TMS-1200 TopMap µ.Lab

TMS-1200 TopMap μ.Lab

With its high spatial resolution, the TMS-1200 TopMap μ.Lab measurement microscope sets new standards in non contact-topography measurement. Simple, quick and precise, it acquires high-resolution topographical maps of functional surfaces and microstructures to determine critical parameters such as flatness, ripple and roughness. Designed specifically to characterize the micro-topography of functional surfaces and microstructures, it is a perfect solution for products in development or in quality control. The instrument has high lateral resolution and can measure surfaces with different reflectivities by using the Smart Surface Scan technique.

  • Rapid, non-contact 3-D topography measurement with subnanometer resolution
  • Determination of structural topography and shape on both rough and specular surfaces
  • Smart Surface Scan technique copes with different contrast (reflectivity) levels
  • Powerful TMS software for processing data to determine topography and to characterize the surface
  • 2-D and 3-D presentation modes with video overlay