Surface Metrology

Surface Metrology

Polytec is addressing the surface metrology market with innovative, high-precision 3-D profilometer technology that works on rough, smooth and stepped surfaces without contact. These products are based on scanning white-light interferometry, also called coherent or vertical scanning interferometry or coherence radar. With their large vertical range and nanometer resolution, they are ideal tools for determining flatness, height differences and parallelism of large surfaces and structures, including soft materials.

3-D Profilometers for Surface Characterization

TMS-500 TopMap
The TMS-500 TopMap is a high-precision, non-contact topography measurement system designed for fast and efficient surface characterization of precision mechanical components.
TMS-100 TopMap Metro.Lab
Designed for measuring large-area topography on most surfaces and has an excellent price/performance ratio.
TMS-300 TopMap In.Line
The ideal metrology system for precisely characterizing and controlling surface quality in a production environment.
TMS-1200 TopMap µ.Lab
A precise optical microscope that features a very high lateral resolution that enables measurements on microstructures such as MEMS.
TMS Software

Surface Metrology Video

Engineering Services

Measurement Services

Rapid and precise - our measurement and rental services fully support and simplify your measurement needs.

Your Contact

US Sales & Service
Optical Metrology

Tel. 949-943-3033
info@polytec.com