Media & Substrate Characterization

Media and Substrate Characterization

Optical Surface Analyzer Technology for Nano-defect and Topography Measurements

Hard disk drives are manufactured with nanometer precision. The slightest change in manufacturing can cause surface roughness variations large enough to cause failures in the field. For the best yields it is necessary to optimize your process. Measuring and understanding the characteristics of your product allows continuous improvement. The AVT-1000 Advanced Vibrometry Tester enables you to measure all critical parameters such as roughness, waviness, and defects across the whole surface of the sample providing important information for process optimization. No other technique can give you such precise, quick, and full surface measurement results.

Applications

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Optical Metrology

Tel. 949-943-3033
info@polytec.com