Date: 9 October, 2013
Time: 08:45-18:00
Location: Erlwein Saal, Messe Dresden
MEMUNITY is pleased to bring you the 2013 MEMS Testing and Metrology Workshop in Cooperation with SEMI.
Current needs, challenges and trends in MEMS development, testing and Metrology will be discussed at a high level expert event taking place at SEMICON Europe in Dresden.
Learn about recent advancements in measurement technology for characterizing mechanical and electrical properties of next generation MEMS devices and discuss about wafer level test strategies and also about standardization issues.  
Technical presentations and discussions will be given by industry experts from leading MEMS manufacturers, research institutes, universities and equipment manufacturers including Robert Bosch GmbH, X-FAB, FEMTO-ST, Cascade Microtech, imec, Fraunhofer ENAS, IHP, IMMS, IMTEK, Polytec, Solidus Technologies, Technical University of Dresden, Tohoku University.
Who should attend?
Technical professionals and executives involved in MEMS development,manufacturing and testing from device manufacturers, MEMS integrators, research institutes and equipment and technology suppliers.

Register now at: