Web Academy
Characterize, Analyze and Validate Surface Metrology with Innovative, High Precision, Optical Surface Profiling Systems
Start date10/11/2017
LocationOnline
Organizer11:00 - 12:00 PST
Description

Learn about the Polytec’s white light interferometers and chromatic confocal point sensors for non-contact measurement of topography. Polytec's unique technology offers significant benefits for measuring precision machined parts with complex, high aspect ratio features. The webinar will cover some applications in the automotive, medical, semiconductor, appliance, MEMS and tribology fields. It will also explain how white light interferometry works and describe some unique features including Smart Surface Scanning, telecentric optics (for measuring around deep holes and steep edges) and the ability to measure large surfaces. It will also introduce our latest products based on chromatic confocal imaging.

Topics will include:
- Concept and theory
- Examples of quality control and R&D applications.

 

Register here:

Characterize, Analyze and Validate Surface Metrology with Innovative, High Precision, Optical Surface Profiling Systems


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