PV/Solar & Semiconductors
Are you involved with innovative technology and advanced materials for photovoltaics, electronics and semiconductors? If so, you will need sophisticated design and evaluation tools for the development, quality control and predictive maintenance of products and their parts. Consider Polytec's broad range of powerful tools for measuring vibration, surface metrology and material parameters.
Measuring the Dynamic Response of Solar Panels
Unlike traditional contact transducer measurement techniques, the measurement of solar panel dynamics with a scanning vibrometer is a non-destructive, non-contact, remote method that allows a highly precise calculation of mechanical properties and can be used to predict service times for newly designed materials.
Surface Metrology of Thin-Film Solar Cells
Laser structuring (or micro-machining) of current thin-film solar cells can be used to remove portions of the silicon layer in order to create a serial connection of single cells within a module. The topography of such laser-processed structures, to analyze large-scale silicon removal or the ablation caused by a single laser pulse, can be easily and precisely measured with a Polytec surface metrology measurement system.