Applications |
Surface measurements are needed in many industries. Components and structures ranging from submillimeter to centimeter size can be found in the semiconductor and data storage industries, in microstructure and sensor markets, and in engineering and automotive applications. |
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Functional Surfaces
Structured functional surfaces with tight tolerances require high-precision measurement systems that can quickly record the surface topography of a work piece or object. White-light interferometry can make vertical measurements with an accuracy of a few nanometers and even subnanometers.
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 Atomizer membrane |
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Bottom Flatness of Blind HolesInspecting blind hole bottoms for flatness and parallelism with respect to the top surface is difficult for high-aspect ratio holes (deep and narrow). The TopMap Pro.Lab can make these measurements for holes under 50 mm deep, and the TopMap Metro.Lab easily allows measurements in drill holes that are up to 70 mm deep.
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 Measurement in blind hole |
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Surface Measurement in Production EnvironmentsSurface properties, such as roughness, are important parameters for quality assurance. High throughput quality control is easily realized using TopMap white-light interferometers. The measurement itself is quick and fully automated, as are the analysis, savings and transfer of the results to the process control software.
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 Surface Measurement in Production |
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Quality Control for Hard Disk ComponentsA manufacturer of various components for hard disk drives such as bearing sleeves, shafts and disk hubs, uses TopMap systems for quality control along with several other measurement techniques. The quality of fluid dynamic bearings (FDB) is of particular interest.
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 Topography of a counterplate |
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Topography of Laser ChipsFor reasons of quality control it is necessary to measure the complete topography of the laser chips. This can easily be done with the Polytec TopMap white light interferometer. Every data point has a x, y and z coordinate so very flexible data analysis can be done.
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 Laser chip measurement |
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Flatness of Plastic FoilsThe topography of transparent plastic foils is measured with the TMS-600 TopMap Pro.Lab system. The amplitude of the waves is of the order of some hundred nanometers. With this measurement it´s possible to control the production process of the plastic foils.
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 Plastic foil topography |
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TopMap Application NotesPolytec Application Notes describe how Polytec’s optical measurement systems are being used in various fields of application in semiconductor and data storage industries, in microstructure and sensor markets, and in engineering and automotive development. The download page lists Application Notes specific to TopMap applications.
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 Polytec Application Note |
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Polytec GmbH • Polytec-Platz 1-7 • 76337 Waldbronn •
Germany
Tel.: +49 (0) 7243 604-0 • Fax: +49 (0) 7243 69944 • Postfach 161
http://www.polytec.de • info@polytec.de
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