The Polytec Topography Measurement Systems are based on white light interferometry. The systems allow flatness and topography measurements of endless objects with specular or rough surfaces with a resolution of up to 1 nm in z direction.
With a large z-dynamic range, the measurement of flatness, ripple and parallelism is simple even under traditionally difficult circumstances such as comparing the top and bottom surfaces of a blind hole. Classic surface parameters currently measured with touch probes can also easily be investigated with TopMap systems.
The TMS Software also offers 3-D image analysis, a LabView driver for easy integration into existing software environments and the ability to export all data in ASCII format.
Surface measurements are needed in many industries. Read more about how Polytec’s white-light interferometers are being used in various fields of application.
Copyright 2007 Polytec GmbH Technical specifications are subject to change
TMS-100 TopMap Metro.Lab
Polytec’s TopMap Metro.Lab is an affordable, high-precision, non-contact topography measurement system with a wide field-of-view and large z-dynamic range designed to characterize flat and curved surfaces. The Metro.Lab can measure flatness and general topography with 20 nanometer resolution and determine parallelity of two or more surfaces separated by as much as 70 mm.
Designed as a compact, industrial inspection system, the TopMap In.Line interferometer easily installs on a manufacturing line and rapidly verifies production part specifications for flatness and topography. Surface heights (z-axis) of 40 nanometers or better can be resolved in the images. Available sample areas range from a rectangular 4.2 mm x 5.5 mm to a circular diameter of 19 mm.
The TopMap Pro.Lab offers the maximum flexibility and accuracy for lab sample surface measurements used for quality control. The vertical resolution is in the nanometer range and intelligent filter systems and software solutions allow measurements on any surface from extremely rough to polished smooth. The system generates high resolution, 3-D topographical images, over a sample area of about 30 mm x 40 mm.
TopMap µ.Lab sets the benchmark for microscope-based, high-precision, non-contact topography measurement with high spatial resolution. It is specifically designed for the micro-topography characterization of functional surfaces and microstructures. Using a scanning white light interferometer, the µ.Lab can quickly measure flatness, waviness, roughness and general topography with sub-nanometer resolution.
Easy to handle data acquisition and analysis software for Polytec's Topography Measurement Systems as wll as the MSA-400 with Topography Option. The software package includes all the necessary commands for instrument operation, data acquisition, analysis and presentation. Outstanding 2-D and 3-D data representation can be enhanced with profile cuts and filter algorithms.
