Polytec’s Laser Vibrometers are widely used both for structural dynamics measurements in the R&D labs and for quality control purposes in the production process.
Copyright 2007 Polytec GmbH Technical specifications are subject to change
PSV-400 Scanning Vibrometer
State-of-the-art measurement technology for the analysis of structural vibrations. Entire surfaces in the mm² to several m² range are rapidly scanned and automatically probed with flexible and interactively created scan grids. S
For resolving noise and vibration issues in the automotive, aerospace, commercial manufacturing and R&D markets
Full analysis of vibration data, including graphing, animation and data export
The high velocity scanning system is based on the PSV-400-H4 and allows vibration measurements up to 20 m/s with a vibration frequency of up to 80 kHz. This, for example, allows simple and intuitive operational deflection shape analysis of engine components or other parts and aggregates in the high velocity range.
The HSV copes with high vibration speeds up to 30 m/s and provides single or dual plus differential velocity and displacement measurement capabilities for high-speed applications like
Valve train testing on motor sports engines
High power transducers, special drilling machines, as well as impact testing
And other measurement tasks requiring high speed LDVs
The RLV-5500 Rotational Laser Vibrometer benefits from digital decoding techniques, an improved S/N ratio and an expanded rpm range of up to 20,000 rpm.
The sensor head design is new, more compact, and small enough to get closer to the measurement object. An integrated air purge system protects the optics from production oil spray and dust. Even onboard measurement of an operating drivetrain in a moving vehicle is now possible.
The MSA-500 Micro System Analyzer is a powerful new all-in-one measurement workstation for precise 3-D dynamic characterization of MEMS and MOEMS microstructures.
Characterize out-of-plane vibrations by Scanning Laser-Doppler Vibrometry
Measure in-plane motion and vibration by Stroboscopic Video Microscopy
Determine surface topography by White Light Interferometry
Test wafers and individual die by combining Polytec’s MSA-500 with a MEMS probe station
